Develop wafer level cost effective test solution for BST ASIC mass production, including test program and test hardware
Support test plan definition for IC production and characterization test and discuss with designer about test feasibility;
Define the tester configuration on the target ATE platform based the test requirement
Enable the final mass production environment at OSAT.
Develop wafer level/sample level test solution for BST ASIC Characterization, including test program and test hardware, support the Characterization data analysis & report generation.
Continuous improve the test work flow, tool sets and methodology.
Work closely across multiple internal/ external teams to ensure test solution alignment across all stages of product life.
Support test cost reduction in mass-production phase.
Qualifications
Major in EE, Microelectronics, CS or related, BSEE required, MSEE preferred
3+ years’ experience with one ATE mainstream tester among 93K/J750/Ultraflex/D10/DX ,V93k platform are preferred;
Strong knowledge in Digital/Analog circuit and circuit test methodology.
Fast learner and good team player
Willingness to work and interact in international teams
C/C++/VB/Perl/Python programming skill
Fluent in both written and spoken English
Low percent international business travel to engineering sites in Stuttgart, Munich, Dresden and Milano